TXRF 2013

The aim of TXRF2013 conference is to bring together experts and users of total reflection X-ray fluorescence analysis to present and discuss recent advances, research results and perspective in this field. Besides instrumentation of TXRF and related methods (X-ray reflectometry, grazing exit XRF, grazing X-ray diffraction, total reflection XAFS, etc.), emphasis will be laid on their potential applications such as semiconductor analysis, environmental analysis, forensic science, biology, etc. As the previous TXRF conferences, the 15th conference will bring together scientists, users, instrument manufacturers, and all who are interested in the chosen subjects. Substantial discussions and exchange of knowledge and experience are encouraged.

The TXRF2013 is a joint international conference with the 49th Annual Conference on X-Ray Chemical Analysis, same as the Awaji TXRF2003 conference. The scope of the 49th Annual Conference on X-Ray Chemical Analysis, which is organized by The Discussion Group of X-Ray Analysis in Japan, is widely ranging in X-ray analysis such as X-ray fluorescence (XRF), X-ray absorption fine structure (XAFS), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), electron probe microanalysis (EPMA), X-ray photoelectron spectroscopy (XPS), particle-induced X-ray emission (PIXE), and any other kinds of analysis methods using X-rays. Main emphasis is on the instrumentation, as well as industrial, environmental, archaeological, forensic, biological, and other applications.

More informations available at http://www.a-chem.eng.osaka-cu.ac.jp/txrf2013/